A novel measurement technique could prevent defects in graphene

Researchers at Pennsylvania’s Lehigh University have reported a breakthrough in efforts to non-invasively characterize the properties of graphene. This work could potentially enable scientists to rapidly monitor levels of strain as graphene is being fabricated, thereby helping to prevent the formation of defects. 

By using Raman spectroscopy, a technique that collects light scattered off a material’s surface, and statistical analysis, the scientists were able to take nanoscale measurements of the strain present at each pixel on the material’s surface and obtain a high-resolution view of the chemical properties of the graphene surface.